| Original Articles |
|
|
|
|
Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method |
| CHENG Chuan-Fu1,2;LIU Chun-Xiang2;TENG Shu-yun1;ZHANG Ning-Yu3;LI Ru-Xin1;XU Zhi-Zhan1 |
| 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 201800
2Department of Physics, Shandong Normal University, Ji’nan 250014
3Shandong Institute of Architecture, Ji’nan 250014 |
|
| Cite this article: |
|
CHENG Chuan-Fu, LIU Chun-Xiang, TENG Shu-yun et al 2002 Chin. Phys. Lett. 19 1283-1286 |
|
|
|
|
Abstract Theoretical analysis shows that the deviation roughness w and lateral correlation length ξ of a weak scattering object determine the different properties of the contrast of the speckles in the image plane of a 4f system. Experimentally, we have measured the data of the speckle contrast versus the radius R of the variable filtering aperture. By fitting the theoretical results to these data, the parameters w and ξ of the random surfaces with Gaussian correlation are extracted. This method can determine the two parameters simultaneously and independently, and pre-calibrations are not needed.
|
| Keywords:
42.25.Fx
42.30.-d
|
|
|
Published: 01 September 2002
|
|
| PACS: |
42.25.Fx
|
(Diffraction and scattering)
|
| |
42.30.-d
|
(Imaging and optical processing)
|
|
|
|
|
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
