Chin. Phys. Lett.  1998, Vol. 15 Issue (12): 901-903    DOI:
Original Articles |
Crystallization of Ternary Amorphous Ni-Y-AI Films Observed by Scanning Tunneling Microscopy
WANG De-liang1,2;U. Geyer2;S. Schneider2
1National Laboratory for Superconductivity, Institute of Physics, Chinese Academy of Sciences, Beijing 100080 21. Physikalisches Institut, Universitaet Goettingen, 37073 Goettingen, Germany
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WANG De-liang, U. Geyer, S. Schneider 1998 Chin. Phys. Lett. 15 901-903
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Abstract Ternary thin Ni90-xYxAl10 films have been prepared by using cocondensation method under ultrahigh vacuum condition. Films with a wide concentration range between Ni80Y10Al10 and Ni20Y70AI10 were found to be amorphous. With an addition of 10at.% AI the thermal stability of binary amorphous NiY has been enhanced. This is caused by a more closely packed structure and the bondings between AI and Ni, Y may also play an important role. The surface investigation by scanning tunneling microscopy suggests that the atom redistribution and the crystallization have been limited in the clusters with a size of about 10.5nm. The nanosized amorphous clusters of Ni80Y10Al10 film have changed to nanosized crystalline with the same size of about 12.3nm when crystallization occurred.
Keywords: 61.43.Fs      61.16.Ch     
Published: 01 December 1998
PACS:  61.43.Fs (Glasses)  
  61.16.Ch  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1998/V15/I12/0901
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