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Abnormal Alignment of Misfit Dislocations in
In0.52Al0.48As/InxGa1-xAs/In0.52AI0.48As/InP Heterostructure
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WU JU1,2;LI Han-xuan1;WANG Zhan-guo1 |
1Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083
2also Laboratory of Electron Microscopy, Chinese Academy of Sciences, Beijing 100080
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Cite this article: |
WU JU, LI Han-xuan, WANG Zhan-guo 1998 Chin. Phys. Lett. 15 50-51 |
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Abstract It was observed with transmission electron microscopy in the In0.52Al0.48As/InxGa1-xAs/In0.52AI0.48As/InP heterostructure that misfit dislocation lines deviate from the <110> directions at a certain angle depending on the indium content x. Such an abnormal alignment of misfit dislocations is explained in terms of an alloy effect on the formation of single jogs on the misfit dislocations in the interface between the III-V ternary compounds.
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Keywords:
61.72.Ff
68.55.Jk
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Published: 01 January 1998
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PACS: |
61.72.Ff
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(Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.))
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68.55.Jk
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Abstract
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