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Gamma-Ray Irradiation Effects on Electroluminescence from Au/Extra Thin Si-Rich SiO2 Film/p-Si Structures |
LI An-ping;ZHANG Bo-rui;QIAO Yong-ping;QIN Guo-gang;MA Zhen-chang1;ZONG Wan-hua1 |
Department of Physics, Peking University, Beijing 100871
1The 13th Institute of the Ministry of Electronic Industry, Shijiazhuang 050051
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Cite this article: |
LI An-ping, ZHANG Bo-rui, QIAO Yong-ping et al 1998 Chin. Phys. Lett. 15 305-307 |
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Abstract We have studied the effects of γ-ray irradiation on electroluminescence (EL) from Au/extra thin Si-rich SiO2 film/p-Si Structures. After γ-ray irradiation, for the structure with a 600°C annealed Si-rich SiO2 film a new blue EL band with a peak at around 480nm was observed, and for the structure with a 300°C annealed Si-rich SiO2 film the red EL band shifts from 670 to 660nm and its intensity and full width at half maximum increase pronouncedly. The experimental results demonstrate that the defects induced by γ-ray irradiation are responsible for the blue EL band as well as for the variations of the red EL band.
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Keywords:
78.60.Fi
78.66.Nk
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Published: 01 April 1998
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