中国物理快报  2018, Vol. 35 Issue (10): 107301-    DOI: 10.1088/0256-307X/35/10/107301
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Temperature-Dependent Effect of Near-Interface Traps on SiC MOS Capacitance
Yan-Jing He, Xiao-Yan Tang**, Yi-Fan Jia, Ci-Qi Zhou, Yu-Ming Zhang
Microelectronics Institute, Xidian University, Xi'an 710071