Defect-Related Photoresponse and Polarization-Sensitive Photodetection of Single ZnO Nanowires

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摘要 Defect-related photoconductivity of single ZnO nanowires is investigated. The photoconductivity shows power-law dependence with incident green laser intensity due to the defect mechanisms including both recombination centres and traps. The device based on single ZnO nanowire shows a sensitive photoresponse to green light with significant on/off ratios. In addition, the photocurrent is highly sensitive to the polarization of the incident illumination. Therefore, the nanowire may act as apolarized photodetector.

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	LIAO Zhi-Min
	XU Jun
	ZHANG Jing-Min
	YU Da-Peng

Abstract：Defect-related photoconductivity of single ZnO nanowires is investigated. The photoconductivity shows power-law dependence with incident green laser intensity due to the defect mechanisms including both recombination centres and traps. The device based on single ZnO nanowire shows a sensitive photoresponse to green light with significant on/off ratios. In addition, the photocurrent is highly sensitive to the polarization of the incident illumination. Therefore, the nanowire may act as apolarized photodetector.

Key words： 72.40.+w 73.63.-b

收稿日期: 2008-03-07 出版日期: 2008-06-26

:	72.40.+w	(Photoconduction and photovoltaic effects)
	73.63.-b	(Electronic transport in nanoscale materials and structures)

引用本文:

LIAO Zhi-Min;XU Jun;ZHANG Jing-Min;YU Da-Peng;. Defect-Related Photoresponse and Polarization-Sensitive Photodetection of Single ZnO Nanowires[J]. 中国物理快报, 2008, 25(7): 2622-2624.
LIAO Zhi-Min, XU Jun, ZHANG Jing-Min, YU Da-Peng,. Defect-Related Photoresponse and Polarization-Sensitive Photodetection of Single ZnO Nanowires. Chin. Phys. Lett., 2008, 25(7): 2622-2624.

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https://cpl.iphy.ac.cn/CN/ 或 https://cpl.iphy.ac.cn/CN/Y2008/V25/I7/2622

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