中国物理快报  2004, Vol. 21 Issue (6): 1143-1146    
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Effect of Annealing Temperature on the Microstructure and Resistivity of Ge2Sb2Te5 Films
LIU Bo1, SONG Zhi-Tang1, FENG Song-Lin1, CHEN Bomy2
1Research Center of Functional Semiconductor Film Engineering and Technology, State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 2Silicon Storage Technology, Inc. 1171 Sonora Court, Sunnyvale, CA 94086, USA
Effect of Annealing Temperature on the Microstructure and Resistivity of Ge2Sb2Te5 Films
LIU Bo1;SONG Zhi-Tang1;FENG Song-Lin1;CHEN Bomy2
1Research Center of Functional Semiconductor Film Engineering and Technology, State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 2Silicon Storage Technology, Inc. 1171 Sonora Court, Sunnyvale, CA 94086, USA