Preparation and Structural Characterization of Superionic Conductor RbAg4I5 Crystalline Grain Film
CAO Yang1, SUN Hong-San2, SUN Jia-Lin1, TIAN Guang-Yan1, XING Zhi3, GUO Ji-Hua1
1Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics, Tsinghua University, Beijing 100084
2Laboratory of CAAD, Tsinghua University, Beijing 100084
3Department of Chemistry, Tsinghua University, Beijing 100084
Preparation and Structural Characterization of Superionic Conductor RbAg4I5 Crystalline Grain Film
CAO Yang1;SUN Hong-San2;SUN Jia-Lin1;TIAN Guang-Yan1;XING Zhi3;GUO Ji-Hua1
1Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics, Tsinghua University, Beijing 100084
2Laboratory of CAAD, Tsinghua University, Beijing 100084
3Department of Chemistry, Tsinghua University, Beijing 100084
Abstract： Superionic conductor RbAg4I5 crystalline grain films were prepared by vacuum thermal evaporation on NaCl crystalline substrates. The surface morphology, microstructure and the electronic energy states of the films were examined by atomic force microscopy, transmission electron microscopy, x-ray diffraction and x-ray photoelectron spectroscopy. The results show that the obtained RbAg4I5 layer has an epitaxial film of perfect crystalline structure, and the unit cell of crystalline grain RbAg4I5 films belongs to cubic crystal system. The principal x-ray diffraction peaks at d = 3.7447 and 1.8733Å are related to the structure of ternary compound RbAg4I5 films.
2003, Vol. 20 
