Double-Crystal x-Ray Diffraction Study on Ta/Al Multilayers
XIU Lisong, YUAN Xiangyang, WU Ziqin, JIANG Shusheng*, HU An*, ZHAO Jiyong**, JIANG Jianhua**
Center for fundamental Physics , University of Science and Technology of China, Hefei 230026
*Laboratory of Microstructure Physics, Nanjing University, Nanjing 210080
**Institute of High Energy Physics, Academia Sinica, Beijing 100039
Double-Crystal x-Ray Diffraction Study on Ta/Al Multilayers
XIU Lisong;YUAN Xiangyang;WU Ziqin;JIANG Shusheng*;HU An*;ZHAO Jiyong**;JIANG Jianhua**
Center for fundamental Physics , University of Science and Technology of China, Hefei 230026
*Laboratory of Microstructure Physics, Nanjing University, Nanjing 210080
**Institute of High Energy Physics, Academia Sinica, Beijing 100039
关键词 ：
68.65.+g ,
61.10.-i ,
68.55.-a
Abstract ： Double-crystal x-ray diffraction has been used to measure the rocking curve of Ta/Al multilayers. The diffraction profiles of the multilayers are different. Besides the normal profile, two kinds of distorted profiles have been found. The simulations show that the deformed profiles of the peaks are caused by the imperfect periodicity (e.g. systematic period deviation and coexistence of two slightly different periods) in the multilayers.
Key words ：
68.65.+g
61.10.-i
68.55.-a
出版日期: 1992-11-01
引用本文:
XIU Lisong;YUAN Xiangyang;WU Ziqin;JIANG Shusheng*;HU An*;ZHAO Jiyong**;JIANG Jianhua**. Double-Crystal x-Ray Diffraction Study on Ta/Al Multilayers[J]. 中国物理快报, 1992, 9(11): 605-608.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y1992/V9/I11/605
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1992, Vol. 9 
