Chin. Phys. Lett.  2017, Vol. 34 Issue (7): 077201    DOI: 10.1088/0256-307X/34/7/077201
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Modelling Magnetoresistance Effect in Limited Anisotropic Semiconductors
Filippov V. V.1,2**, Mitsuk S.V.1
1Lipetsk State Pedagogical University of P. P. Semenov-Tyan-Shansky, Lipetsk 398020, the Russian Federation
2Lipetsk State Technical University, Lipetsk 398600, the Russian Federation
Cite this article:   
Filippov V. V., Mitsuk S.V. 2017 Chin. Phys. Lett. 34 077201
Download: PDF(767KB)   PDF(mobile)(769KB)   HTML
Export: BibTeX | EndNote | Reference Manager | ProCite | RefWorks
Abstract A macroscopic model of the magnetoresistance effect in limited anisotropic semiconductors is built. This model allows us to solve the problem of measurement of physical magnetoresistance components of crystals and films. Based on a unified mathematical model the method is worked out enabling us to measure tensor components of the specific electrical resistance and the relative magnetoresistance of anisotropic semiconductors simultaneously.
Received: 23 March 2017      Published: 23 June 2017
PACS:  72.80.Cw (Elemental semiconductors)  
TRENDMD:   
URL:  
https://cpl.iphy.ac.cn/10.1088/0256-307X/34/7/077201       OR      https://cpl.iphy.ac.cn/Y2017/V34/I7/077201
Service
E-mail this article
E-mail Alert
RSS
Articles by authors
Filippov V. V.
Mitsuk S.V.
[1]Naoto N et al 2010 Rev. Mod. Phys. 82 1539
[2]Kabirov Y V et al 2016 Phys. Solid State 58 1304
[3]Lin C J, Shi Y G and Li Y Q 2016 Chin. Phys. Lett. 33 077501
[4]Chen J J et al 2016 Chin. Phys. Lett. 33 047501
[5]Sheng L M et al 2008 Chin. Phys. Lett. 25 3397
[6]Bakhadirkhanov M K et al 2014 Semiconductors 48 986
[7]Baranskij P I et al 1977 Jelektricheskie i gal'vanomagnitnye javlenija v anizotropnyh poluprovodnikah (Kiev: Naukova dumka) (in Russian)
[8]Filippov V V and Bormontov E N 2013 Semiconductors 47 884
[9]Filippov V V 2015 Osobennosti javlenij jelektronnogo perenosa v anizotropnyh poluprovodnikah (Moscow: Sputnik) (in Russian)
[10]Nemov S A et al 2009 Semiconductors 43 1585
[11]Marenkin S F and Trukhan V M 2010 Phosphides, Arsenides of Zinc and Cadmium (Minsk: Varaschin) (in Russian)
[12]Askerov B M 1994 Electron Transport Phenomena in Semiconductors (Singapore: World Scientific)
[13]Landau L D and Lifshitz E M 1984 Electrodynamics of Continuous Media (New York: Oxford)
[14]Edwards R E 1979 Fourier Series a Modern Introduction (New York: Springer-Verlag)
[15]Seeger K 1973 Semiconductor Physic (New York: Springer)
[16]Batavin V V, Kontsevoi Yu A and Fedorovich Yu V 1985 Measurement of Parameters and Structures of Semiconductor Materials (Moscow: Radio i Svyaz') (in Russian)
[17]Gurevich Y G and Kucherenko Y G 2001 Europhys. Lett. 53 539
Related articles from Frontiers Journals
[1] Han Zhang, Chen Ming, Ke Yang, Hao Zeng, Shengbai Zhang, and Yi-Yang Sun. Chalcogenide Perovskite YScS$_{3}$ as a Potential p-Type Transparent Conducting Material[J]. Chin. Phys. Lett., 2020, 37(9): 077201
[2] Gen Yue, Zhen Deng, Sen Wang, Ran Xu, Xinxin Li, Ziguang Ma, Chunhua Du, Lu Wang, Yang Jiang, Haiqiang Jia, Wenxin Wang, Hong Chen. Absorption Enhancement of Silicon Solar Cell in a Positive-Intrinsic-Negative Junction[J]. Chin. Phys. Lett., 2019, 36(5): 077201
[3] Junkang Li, Yiming Qu, Siyu Zeng, Ran Cheng, Rui Zhang, Yi Zhao. Ge Complementary Tunneling Field-Effect Transistors Featuring Dopant Segregated NiGe Source/Drain[J]. Chin. Phys. Lett., 2018, 35(11): 077201
[4] FILIPPOV V. V., VLASOV A. N.. Express Methods for Measurement of Electroconductivity of Semiconductor Layered Crystal[J]. Chin. Phys. Lett., 2015, 32(11): 077201
[5] MA Xue-Zhi, ZHANG Rui, SUN Jia-Bao, SHI Yi, ZHAO Yi. Reduction of Reactive-Ion Etching-Induced Ge Surface Roughness by SF6/CF4 Cyclic Etching for Ge Fin Fabrication[J]. Chin. Phys. Lett., 2015, 32(4): 077201
[6] YUAN Heng, ZHANG Ji-Xing, ZHANG Chen, ZHANG Ning, XU Li-Xia, DING Ming, Patrick J. Clarke. Low Gate Voltage Operated Multi-emitter-dot H+ Ion-Sensitive Gated Lateral Bipolar Junction Transistor[J]. Chin. Phys. Lett., 2015, 32(02): 077201
[7] WANG Hong-Juan, HAN Gen-Quan, LIU Yan, YAN Jing, ZHANG Chun-Fu, ZHANG Jin-Cheng, HAO Yue. Germanium PMOSFETs with Low-Temperature Si2H6 Passivation Featuring High Hole Mobility and Superior Negative Bias Temperature Instability[J]. Chin. Phys. Lett., 2014, 31(05): 077201
[8] ZHANG Li-Ning, MEI Jin-He, ZHANG Xiang-Yu, TAO Jin, HU Yue, HE Jin, CHAN Mansun. A Comparative Study of Ballistic Transport Models for Nanowire MOSFETs[J]. Chin. Phys. Lett., 2013, 30(11): 077201
[9] DENG Ning, TANG Jian-Shi, ZHANG Lei, ZHANG Shu-Chao, CHEN Pei-Yi. Spin Injection from Ferromagnetic Metal Directly into Non-Magnetic Semiconductor under Different Injection Currents[J]. Chin. Phys. Lett., 2010, 27(9): 077201
[10] XU Yue, YAN Feng, CHEN Dun-Jun, SHI Yi, WANG Yong-Gang, LI Zhi-Guo, YANG Fan, WANG Jos-Hua, LIN Peter, CHANG Jian-Guang. Improved Programming Efficiency through Additional Boron Implantation at the Active Area Edge in 90nm Localized Charge-Trapping Non-volatile Memory[J]. Chin. Phys. Lett., 2010, 27(6): 077201
[11] JIANG Ruolian, LIU Jianlin, ZHENG Youdou*, ZHENG Guozhen*, WEI Yayi*, SHEN Xuechu*. High Hole Mobility Si/Sil-xGex/Si Heterostructure[J]. Chin. Phys. Lett., 1994, 11(2): 077201
[12] LI Jianming. NOVEL SEMICONDUCTOR SUBSTRATE FO-D BY HYDROGEN ION IMPLANTATION INTO SILICON [J]. Chin. Phys. Lett., 1989, 6(10): 077201
Viewed
Full text


Abstract