| CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES |
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Raman Scattering Modification in Monolayer ReS$_{2}$ Controlled by Strain Engineering |
| Ting-Hui Li1**, Zi-Heng Zhou3, Jun-Hong Guo2, Fang-Ren Hu2** |
1College of Electronic Engineering, Guangxi Normal University, Guilin 541004
2School of Optoelectronic Engineering and Grüenberg Research Centre, Nanjing University of Posts and Telecommunicates, Nanjing 210023
3Department of Physics, and National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093
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| Cite this article: |
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Ting-Hui Li, Zi-Heng Zhou, Jun-Hong Guo et al 2016 Chin. Phys. Lett. 33 046201 |
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Abstract Regulation of optical properties and electronic structure of two-dimensional layered ReS$_{2}$ materials has attracted much attention due to their potential in electronic devices. However, the identification of structure transformation of monolayer ReS$_{2}$ induced by strain is greatly lacking. In this work, the Raman spectra of monolayer ReS$_{2}$ with external strain are determined theoretically based on the density function theory. Due to the lower structural symmetry, deformation induced by external strain can only regulate the Raman mode intensity but cannot lead to Raman mode shifts. Our calculations suggest that structural deformation induced by external strain can be identified by Raman scattering.
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Received: 06 January 2016
Published: 29 April 2016
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