| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Growth of High-Quality Superconducting FeSe0.5Te0.5 Thin Films Suitable for Angle-Resolved Photoemission Spectroscopy Measurements via Pulsed Laser Deposition |
| KONG Wan-Dong1, LIU Zhi-Guo1, WU Shang-Fei1, WANG Gang1, QIAN Tian1, YIN Jia-Xin1**, RICHARD Pierre1,2, YAN Lei1**, DING Hong1,2 |
1Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190
2Collaborative Innovation Center of Quantum Matter, Beijing 100871
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| Cite this article: |
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KONG Wan-Dong, LIU Zhi-Guo, WU Shang-Fei et al 2015 Chin. Phys. Lett. 32 087401 |
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Abstract High-quality superconducting FeSe0.5Te0.5 films are epitaxially grown on different substrates by using the pulsed laser deposition method. By measuring the transport properties and surface morphology of films grown on single-crystal substrates of Al2O3 (0001), SrTiO3 (001), and MgO (001), as well as monitoring the real-time growth process on MgO substrates with reflection high energy electron diffraction, we find the appropriate parameters for epitaxial growth of high-quality FeSe0.5Te0.5 thin films suitable for angle-resolved photoemission spectroscopy measurements. We further report the angle-resolved photoemission spectroscopy characterization of the superconducting films. The clearly resolved Fermi surfaces and the band structure suggest a sample quality that is as good as that of high-quality single-crystals, demonstrating that the pulsed laser deposition method can serve as a promising technique for in situ preparation and manipulation of iron-based superconducting thin films, which may bring new prosperity to angle-resolved photoemission spectroscopy research on iron-based superconductors.
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Received: 28 April 2015
Published: 02 September 2015
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