| ATOMIC AND MOLECULAR PHYSICS |
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Multiple Ionization of Argon Induced by Carbon Ions at 20–500 keV/u Energies |
| NIU Shu-Tong1, LIU Wen-Biao1, YANG Ai-Xiang1, HAN Cheng-Zhi1, HU Wei1,2, WEN Zhi-Wen1, GAO Zhi-Min3, SHAO Jian-Xiong1, CHEN Xi-Meng1** |
1School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000
2No.504 Plant, China National Nuclear Corporation, Lanzhou 730065
3Gansu Nuclear and Radiation Safety Center, Lanzhou 730000
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| Cite this article: |
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NIU Shu-Tong, LIU Wen-Biao, YANG Ai-Xiang et al 2015 Chin. Phys. Lett. 32 073401 |
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Abstract We measure the multiple ionization cross-section ratios Rk1 of Ar impacted by Cq+ (q=1–3) ions in the energy range of 20–500 keV/u. The measured ratios Rk1 increase with the projectile energy at lower energies, and reach the maximum at energies of 50–150 keV/u, then decrease for higher energies. We also use the classical over barrier ionization model to calculate the ratios Rk1, and the calculation results are in good agreement with the data, which suggest that the multiple ionization process is described by the sequential over-barrier ionization process.
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Received: 08 March 2015
Published: 30 July 2015
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| PACS: |
34.50.Fa
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(Electronic excitation and ionization of atoms (including beam-foil excitation and ionization))
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34.80.Dp
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(Atomic excitation and ionization)
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