CROSS-DISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY |
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Metallic Contaminant Detection using a High-Temperature Superconducting Quantum Interference Devices Gradiometer |
Saburo Tanaka1, Tomohiro Akai1, Makoto Takemoto1, Yoshimi Hatsukade1, Takeyoshi Ohtani2, Yoshio Ikeda2, Shuichi Suzuki2 |
1Toyohashi University of Technology, 1-1 Hibarigaoka, Tempaku-cho, Toyohashi, Aichi 441-8580, Japan 2Advance Food Technology Co., Ltd., Toyohashi, Aichi 441-8113, Japan |
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Cite this article: |
Saburo Tanaka, Tomohiro Akai, Makoto Takemoto et al 2010 Chin. Phys. Lett. 27 088503 |
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Abstract We develop magnetic metallic contaminant detectors using high-temperature superconducting quantum interference devices (HTS-SQUIDs) for industrial products. Finding ultra-small metallic contaminants is an important issue for manufacturers producing commercial products such as lithium ion batteries. If such contaminants cause damages, the manufacturer of the product suffers a big financial loss due to having to recall the faulty products. Previously, we described a system for finding such ultra-small particles in food. In this study, we describe further developments of the system, for the reduction of the effect of the remnant field of the products, and we test the parallel magnetization of the products to generate the remnant field only at both ends of the products. In addition, we use an SQUID gradiometer in place of the magnetometer to reduce the edge effect by measuring the magnetic field gradient. We test the performances of the system and find that tiny iron particles as small as 50×50 μm2 on the electrode of a lithium ion battery could be clearly detected. This detection level is difficult to achieve when using other methods.
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Keywords:
85.25.Dq
81.70.-q
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Received: 07 June 2010
Published: 28 July 2010
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PACS: |
85.25.Dq
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(Superconducting quantum interference devices (SQUIDs))
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81.70.-q
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(Methods of materials testing and analysis)
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[1] Bick M, Sullivan P, Tilbrook D L, Du J, Thorn B, Binks R, Sharman C, Leslie K E, Hinsch A, Macrae K and Foley C P 2005 Supercond. Sci. Technol. 18 346 [2] Krause H J, Panaitov G I, Wolter N, Lomparski D, Zander W, Zhang Y, Oberdoerffer E, Wollersheim D and Wilke W 2005 IEEE Trans. Appl. Supercond. 15 729 [3] Tanaka S, Natsume M, Uchida M, Hotta N, Matsuda T, Aspanut Z and Hatsukade Y 2004 Supercond. Sci. Technol. 17 620 [4] SaburoTanaka, Fujita H, Hatsukade Y, Otani T, Suzuki S and Nagaishi T 2007 Supercond. Sci. Technol. 20 S385 [5] Tanaka S, Yamazaki O, Shimizu R and Saito Y 1999 Supercond. Sci. Technol. 12 809 [6] Tanaka S, Akai T, Hatsukade Y, Otani T and Suzuki S 2009 IEEE Trans. Appl. Supercond. 19 882 [7] Tanaka S, Akai T, Hatsukade Y and Suzuki S 2008 IEICE Trans. Electron. E92-C 323
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