Chin. Phys. Lett.  2010, Vol. 27 Issue (11): 113404    DOI: 10.1088/0256-307X/27/11/113404
ATOMIC AND MOLECULAR PHYSICS |
Single-Electron Detachment for Ti-, Fe-, Co-, Ni-, and Cu-, in Collision with Ar
BAI Xue1,2, ZHAO Jun1,2, WEI Bao-Ren1,2, ZHANG Xue-Mei1,2**
1Key Laboratory of Applied Ion Beam Physics (Ministry of Education), Fudan University, Shanghai 200433
2Institute of Modern Physics, Department of Nuclear Science and Technology, Fudan University, Shanghai 200433
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BAI Xue, ZHAO Jun, WEI Bao-Ren et al  2010 Chin. Phys. Lett. 27 113404
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Abstract By using the micro-channel plate position sensitive detector with the delay-line anode we measure the single electron detachment cross sections for some transition elements in collision with Ar in the energy region 10-30 keV. These single electron detachment cross sections perform as velocity and electron affinity dependences. The experiments are carried out using the growth rate method.
Keywords: 34.50.-s      34.80.Dp     
Received: 17 May 2010      Published: 22 October 2010
PACS:  34.50.-s (Scattering of atoms and molecules)  
  34.80.Dp (Atomic excitation and ionization)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/27/11/113404       OR      https://cpl.iphy.ac.cn/Y2010/V27/I11/113404
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BAI Xue
ZHAO Jun
WEI Bao-Ren
ZHANG Xue-Mei
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