Chin. Phys. Lett.  2005, Vol. 22 Issue (11): 2973-2976    DOI:
Original Articles |
Structure and Photoluminescence of Polycrystalline MgxZn1-xO Films
ZHAO Yi-Kun1;LIAN Jie1;WANG Qing-Pu1;ZHANG Xi-Jian2;ZHANG Sa-Sa1;WANG Gong-Tang3
1School of Information Science and Engineering, Shandong University, Jinan 250100 2School of Physics and Microelectronics, Shandong University, Jinan 250100 3College of Physics, Shandong Normal University, Jinan 250014
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ZHAO Yi-Kun, LIAN Jie, WANG Qing-Pu et al  2005 Chin. Phys. Lett. 22 2973-2976
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Abstract Different photoluminescence (PL) spectra are observed for rf magnetron sputtered polycrystalline Mg0.25Zn0.75O and Mg0.37Zn0.63O films on silicon substrates when excited by different wavelengths. When the excitation wavelength is 280nm, a UV emission peak at 370nm and a blue peak at 462nm are generated for the Mg0.25Zn0.75O film, and those two peaks for the Mg0.37Zn0.63O film shift to 366nm and 466nm, respectively. The wavelengths of the PL peaks are related to the excitation wavelength. The stronger peak is obtained in the blue band due to a large number of oxygen vacancies caused by excess Zn and Mg atoms, while the weaker peak is obtained in the ultraviolet band.
Keywords: 81.15.Cd      68.55.Jk      78.55.Et     
Published: 01 November 2005
PACS:  81.15.Cd (Deposition by sputtering)  
  68.55.Jk  
  78.55.Et (II-VI semiconductors)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2005/V22/I11/02973
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ZHAO Yi-Kun
LIAN Jie
WANG Qing-Pu
ZHANG Xi-Jian
ZHANG Sa-Sa
WANG Gong-Tang
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