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Measurement of the Third-Order Nonlinear Optical Coefficient of ZnO Crystals by Using ICCD-Z-Scan |
| JIA Guang-Ming1,2;ZHANG Gui-Zhong1,2;XIANG Wang-Hua1,2;J. B. Ketterson3 |
| 1College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072
2Key Laboratory of Optoelectronics Information and Technical Science (Ministry of Education), Tianjin 300072
3Department of Physics and Astronomy, Northwestern University, Evanston, IL 60208, USA |
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| Cite this article: |
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JIA Guang-Ming, ZHANG Gui-Zhong, XIANG Wang-Hua et al 2004 Chin. Phys. Lett. 21 1356-1358 |
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Abstract We present an image-intensified charge-coupled-device (ICCD) version of Z-scan by employing an ICCD detector and fixing the sample at the beam waist, and a measurement of the third-order nonlinear optical coefficient of single crystal zinc oxide (ZnO). The X(3) value of -9.1 x 10-15cm2/W measured is in agreement with the published result. Our Z-scan configuration of placing sample at beam waist and collecting the whole wavefront by an ICCD detector is simple and can be deployed in cryogenic research where the sample cannot be Z-scanned.
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| Keywords:
78.20.Ci
78.66.Li
42.65.Jx
42.62.Fi
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Published: 01 July 2004
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| PACS: |
78.20.Ci
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(Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))
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78.66.Li
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(Other semiconductors)
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42.65.Jx
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(Beam trapping, self-focusing and defocusing; self-phase modulation)
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42.62.Fi
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(Laser spectroscopy)
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