| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Remanence Enhancement Effect in Ni$_{0.7}$Zn$_{0.3}$Fe$_{2}$O$_{4}$/Co$_{0.8}$Fe$_{2.2}$O$_{4}$ Ferrite Multilayer Film |
| Cheng-Hua Fan1,2, Qun-Jing Wang1, Zhen-Fa Zi2** |
1School of Electrical Engineering and Automation, Anhui University, Hefei 230601
2School of Electrical and Information Engineering, Hefei Normal University, Hefei 230601
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| Cite this article: |
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Cheng-Hua Fan, Qun-Jing Wang, Zhen-Fa Zi 2016 Chin. Phys. Lett. 33 117304 |
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Abstract Ni$_{0.7}$Zn$_{0.3}$Fe$_{2}$O$_{4}$/Co$_{0.8}$Fe$_{2.2}$O$_{4}$ (NZFO/CFO) multilayer films are fabricated on Si(100) substrates by the chemical solution deposition method. The microstructure and magnetic properties are systematically investigated. The results of field-emission scanning electronic microscopy show that the grain size of the NZFO/CFO multilayer film is quite uniform and the thickness is about 300 nm. The remanence enhancement effect of the NZFO/CFO multilayer film can be mainly attributed to the exchange coupling interaction between NZFO and CFO ferrite films, which is in favor of the design and fabrication of modern electronic devices.
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Received: 24 May 2016
Published: 28 November 2016
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| PACS: |
73.61.-r
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(Electrical properties of specific thin films)
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73.90.+f
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(Other topics in electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures)
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| Fund: Supported by the National Natural Science Foundation of China under Grant Nos 11274314, 11374304, 51102072, 21201052 and U1632161, the Natural Science Major Foundation of Anhui Provincial Higher Education Institutions under Grant No KJ2012ZD14, the Natural Science Foundation of Anhui Province under Grant No 1508085MA18, the Postdoctoral Science Foundation of China under Grant No 2013M541848, and the Foundation for University Key Teachers from Hefei Normal University under Grant No 2014136JKC08. |
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| [1] | Cui W B, Takahashi Y K and Hono K 2012 Adv. Mater. 24 6530 | | [2] | Hou F C, Cheng Y, Lou L et al 2013 Mater. Lett. 108 186 | | [3] | Zhang Y M, Li W, Li H L et al 2014 J. Phys. D 47 015002 | | [4] | Sepehri-Amin H, Liu J, Ohkubo T et al 2013 Scr. Mater. 69 647 | | [5] | Liu Z W, Qian D Y, Zhao L Z et al 2014 J. Alloys Compd. 606 44 | | [6] | Ma Y L, Shen Q, Liu X B et al 2014 J. Appl. Phys. 115 17A704 | | [7] | Kneller E F and Hawig R 1991 IEEE Trans. Magn. 27 3588 | | [8] | Skomski R and Coey J M D 1993 Phys. Rev. B 48 15812 | | [9] | Zhang J, Takahashi Y K, Gopalan R et al 2005 Appl. Phys. Lett. 86 122509 | | [10] | Fullerton E E, Jiang J S, Grimsditch M et al 1998 Phys. Rev. B 58 12193 | | [11] | Horikawa R, Fukunaga H, Nakano M et al 2014 J. Appl. Phys. 115 17A707 | | [12] | Pop V, Gutoiu S, Dorolti E et al 2013 J. Alloys Compd. 581 821 | | [13] | Gong W and Hadjipanayis G C 1994 J. Appl. Phys. 75 6649 | | [14] | Cheng Z H, Zhang J X, Guo H Q et al 1998 Appl. Phys. Lett. 72 1110 | | [15] | Withwanawasam L, Murphy A S, Hadjipanayis G C et al 1994 J. Appl. Phys. 76 7065 | | [16] | Kobayashi T, Yamasaki M and Hamano M 2000 J. Appl. Phys. 87 6579 | | [17] | Hirosawa S, Kanekiyo H and Uehara M 1993 J. Appl. Phys. 73 6488 | | [18] | Zhang J, Zhang S Y, Zhang H W et al 2001 J. Appl. Phys. 89 2857 | | [19] | Liu J P, Liu Y, Skomski R et al 1999 J. Appl. Phys. 85 4812 | | [20] | Zhang H E, Zhang B F, Wang G F et al 2007 J. Magn. Magn. Mater. 312 126 | | [21] | Zi Z F, Lei H C, Zhu X D et al 2010 Mater. Sci. Eng. B 167 70 | | [22] | Júnior A F, Zapf V and Egan P 2007 J. Appl. Phys. 101 09M506 | | [23] | Zi Z F, Zhang S B, Wang B et al 2010 J. Magn. Magn. Mater. 322 148 | | [24] | Stancu A and Ppusoi C 1994 IEEE Trans. Magn. 30 4308 | | [25] | Betancourt I, Barrera V and Elizalde-Galindo J T 2016 J. Supercond. Novel Magn. 29 2407 | | [26] | Soares J M, Cabral F A O, Araújo J H de et al 2011 Appl. Phys. Lett. 98 072502 | | [27] | Hou Y L, Sun S H, Rong C B et al 2007 Appl. Phys. Lett. 91 153117 | | [28] | Choi Y, Jiang J S, Pearson J E et al 2007 Appl. Phys. Lett. 91 022502 |
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