| FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
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End-Output Coupling Efficiency Measurement of Silicon Wire Waveguides Based on Correlated Photon Pair Generation |
| LV Ning, ZHANG Wei**, GUO Yuan, ZHOU Qiang, HUANG Yi-Dong, PENG Jiang-De |
State Key Laboratory on Integrated Optoelectronics, Tsinghua National Laboratory for Information Science and Technology, Department of Electronic Engineering, Tsinghua University, Beijing 100084
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| Cite this article: |
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LV Ning, ZHANG Wei, GUO Yuan et al 2013 Chin. Phys. Lett. 30 074205 |
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Abstract A method to measure the end-output coupling efficiencies between silicon wire waveguides (SWWs) and optical fibers is proposed and demonstrated. The end-output coupling efficiency is calculated through four measured counting rates based on the correlated photon pair generation in the SWW. It provides a way to investigate and optimize the coupling processes at the input and output end of the optical waveguides separately.
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Received: 10 January 2013
Published: 21 November 2013
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| PACS: |
42.50.Ex
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(Optical implementations of quantum information processing and transfer)
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42.65.Wi
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(Nonlinear waveguides)
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[1] Tsuchizawa T, Yamada K, Fukuda H, Watanabe T, Takahashi J, Takahashi M, Shoji T, Tamechika E, Itabashi S and Morita H 2005 IEEE J. Sel. Top. Quantum Electron. 11 232
[2] Kimerling L C 2000 Appl. Surf. Sci. 159 8
[3] Shoji T, Tsuchizawa T, Watanabe T, Yamada K and Morita H 2002 Electron. Lett. 38 1669
[4] Tao S H, Song J F, Fang Q, Yu M B, Lo G Q and Kwong D L 2008 Opt. Express 16 20803
[5] Doylend J K and Knights A P 2006 IEEE J. Sel. Top. Quantum Electron. Electron. 12 1363
[6] klyshko D N 1977 Sov. J. Quantum Electron. 7 591
[7] Migdall A 1999 Phys. Today 52 41
[8] Hong C K, Mandel L 1986 Phys. Rev. Lett. 56 58
[9] Kwiat P G, Waks E, White A G, Appelbaum I and Eberhard P H 1999 Phys. Rev. A 60 R773
[10] Tanzilli S, De Riedmatten H, Tittel W, Zbinden H, Baldi P, De Micheli M, Ostrowsky D B and Gisin N 2001 Electron. Lett. 37 26
[11] Takesue H, Inoue K, Tadanaga O, Nishida Y and Asobe M 2005 Opt. Lett. 30 293
[12] Fiorentino M, Voss P L, Sharping J E and Kumar P 2002 IEEE Photon. Technol. Lett. 14 983
[13] Li X Y, Chen J, Voss P, Sharping J, Kumar P 2004 Opt. Express 12 3737
[14] Huang J F, Liu B H, Fang B, Huang Y F and Guo G C 2009 Chin. Phys. Lett. 26 074214
[15] Zhang S T, Zhang W, Zhou Q, Huang Y D and Peng J D 2009 Chin. Phys. Lett. 26 034206
[16] Zhou Q, Zhang W, Cheng J R, Huang Y D and Peng J D 2010 Opt. Express 18 17114
[17] Fukuda H, Yamada K, Shoji T, Takahashi M, Tsuchizawa T, Watanabe T, Takahashi J and Itabashi S 2005 Opt. Express 13 4629
[18] Sharping J E, Lee K F, Foster M A, Turner A C, Schmidt B S, Lipson M, Gaeta A L and Kumar P 2006 Opt. Express 14 12388
[19] Clemmen S, Huy K P, Bogaerts W, Baets R G, Emplit Pand Massar S 2009 Opt. Express 17 16558
[20] Cheng J R, Zhang W, Zhou Q, Feng X, Huang Y D and Peng J D 2010 Chin. Phys. Lett. 27 124208
[21] Claps R, Dimitropoulos D, Yan H and Jalali B 2002 Opt. Express 10 1305
[22] Almeida V R, Panepucci R R and Lipson M 2003 Opt. Lett. 28 1302 |
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