| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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A GaN p–i–p–i–n Ultraviolet Avalanche Photodiode |
| ZHENG Ji-Yuan1, WANG Lai1**, HAO Zhi-Biao1, LUO Yi1, WANG Lan-Xi2, CHEN Xue-Kang2 |
1Tsinghua National Laboratory for Information Science and Technology, State Key Laboratory on Integrated Optoelectronics, Department of Electronic Engineering, Tsinghua University, Beijing 100084
2Science and Technology on Surface Engineering Laboratory, Lanzhou Institute of Physics, Lanzhou 730000 |
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| Cite this article: |
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ZHENG Ji-Yuan, WANG Lai, HAO Zhi-Biao et al 2012 Chin. Phys. Lett. 29 097804 |
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Abstract A separated absorption and multiplication GaN p–i–p–i–n avalanche photo-diode (APD) with a 25 μm diameter mesa is proposed and demonstrated. Compared to the conventional p–i–n APD, the p–i–p–i–n structure reduces the probability of premature micro-plasma breakdown, raises the gain from 30 to 400 and reduces the work voltage from 93 to 48 V. The temperature test is set on p–i–p–i–n APDs, and the positive coefficient of 30 mV/K shows that avalanche breakdown happens in the devices. The peak responsivity of p–i–p–i–n APDs is 0.11 A/W under a wavelength of 358 nm.
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Received: 18 June 2012
Published: 01 October 2012
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| PACS: |
78.66.Fd
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(III-V semiconductors)
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85.60.Dw
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(Photodiodes; phototransistors; photoresistors)
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85.60.Gz
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(Photodetectors (including infrared and CCD detectors))
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85.60.Bt
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(Optoelectronic device characterization, design, and modeling)
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