| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
|
|
|
|
A Universal Formula for the Secondary Electron Yield of Metals at an Incident Angle of θ |
| XIE Ai-Gen**, ZHANG Jian, WANG Tie-Bang
|
| College of Math and Physics, Nanjing University of Information Science and Technology, Nanjing 210044 |
|
| Cite this article: |
|
XIE Ai-Gen, ZHANG Jian, WANG Tie-Bang 2011 Chin. Phys. Lett. 28 097901 |
|
|
|
|
Abstract Based on the main physical processes, we deduce the relationships among the incident energy Wp0 of the primary electron, the number of released secondary electrons (i.e. δPEθ) per primary electron entering the metal at incident angle θ and the angle θ itself. In addition, the relationship of δ PEθ at θ = 0°, i.e. δPE0, with Wp0 is determined. From the experimental results, the relationship of the ratio at θ = 0°, i.e. β0 which is the ratio of the average number of released secondary electrons generated by a single primary electron backscattered at the metal surface to that generated by a single primary electron entering the metal, with Wp0 is determined. Moreover, the relationships among the ratio βθ , Wp0 and θ are obtained. Based on the relationships among the secondary electron yield at θ (i.e. δθ), the yield at θ = 0° (i.e. δ0), the backscattering coefficient at θ (i.e. ηθ), the coefficient at θ = 0° (i.e. η0), δPEθ and δPE0, we deduce the universal formula for δθ,δ0, ηθ, η0, and Wp0 for the primary electrons at an incident energy of 2–10 keV. The secondary electron yields calculated from the universal formula and the experimental yields of some metals are compared, and the results suggest that the proposed formula is universal for estimation of secondary electron yields at θ=0°−80°.
|
| Keywords:
79.20.Hx
|
|
|
Received: 04 June 2011
Published: 30 August 2011
|
|
| PACS: |
79.20.Hx
|
(Electron impact: secondary emission)
|
|
|
|
|
|
[1] Nishimura K, Kawata J and Ohya K 2000 Nucl. Instrum. Methods. B 164-165 903
[2] Xie A G, Li C Q and Wang T B 2009 Mod. Phys. Lett. B 23 2331
[3] Lei W, Zhang X B and Zhou X D 2005 Appl. Surf. Sci. 251 170
[4] Xie A G, Zhao H F, Song B and Pei Y J 2009 Nucl. Instrum. Methods. B 267 1761
[5] Hopman H J, Verhoeven J, Bachmann P K, Wilson H and Kroon R 1999 Diamond Relat. Mater. 8 1033
[6] Lee W, Baik Y J, Kang C J and Jeon D 2003 Appl. Surf. Sci. 215 265
[7] Kazami Y, Junichiro K and Norio O 2009 Appl. Surf. Sci. 256 958
[8] Yasuda M, Tamura K and Kawata H 2001 Appl. Surf. Sci. 169-170 78
[9] Kanaya K and Kawakatsu H 1972 J. Phys. D 5 1727
[10] Bronshtein I M and Denisov S S 1967 Sov. Phys. Solid State 9 731
[11] Bronshtein I M and Dolinin V A 1968 Sov. Phys. Solid State 9 2133
[12] Reimer L and Pfefferkorn G 1977 (Berlin: Springer) p 34
[13] Laframboise J G and Kamitsuma M 1983 Workshop on Natural Charging of Large Space Structures in Near Earth Polar Orbit ed Sagalyn R C, Donatelli D E and Michael I ( Massachusetts: Air Force Geophysics Laboratory) p 293
[14] Ganachaud J P and Mokrani A 1995 Surf. Sci. 334 329
[15] Kuhr J C and Fitting H J 1999 Electron J. Spectrosc. Relat. Phenom. 105 257
[16] Dapor M 2009 Nucl. Instrum. Methods Phys. Res. B 267 3055
[17] Lin Y and Joy D C 2005 Surf. Interface Anal. 37 895
[18] Seiler H 1983 J. Appl. Phys. 54 R1
[19] Fijol J J, Then A M and Tasker G W 1991 Appl. Surf. Sci. 48/49 464
[20] Reimer L and Drescher H 1977 J. Phys. D 10 805
[21] Copeland P L 1940 Phys. Rev. 58 604
[22] Ono S and Kanaya K 1979 J. Phys. D 12 619
[23] Drescher H, Reimer L and Seidel H 1970 Z. Angew. Phys. 29 331
[24] Prokopenko S M L and Laframboise J G 1977 Proc. Spacecraft Charging Technology Conference ed Pike C P and Lovell R R (Cleveland Ohio: Lewis Research Center) p 369
[25] Sternglass E J 1954 Phys. Rev. 95 352
[26] http://eesd.mc-set.com/make_gra ph2.php?bText=1&n_plots\\=1&sel_signal=1&n_vals=1&mtvar[]=54&mtvar
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
