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Planar Channelling Criticalities of MeV Protons in Si Crystal: Simulations, Evaluation and Applications |
| Mukhtar Ahmed Rana |
| Methodology Applications Initiative, Physics Division, PINSTECH, Post Office Nilore, Islamabad, Pakistan |
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| Cite this article: |
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Mukhtar Ahmed Rana 2008 Chin. Phys. Lett. 25 3724-3727 |
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Abstract We reports a phase-space structure of MeV proton beam planar channelled along {110} planes in Si crystal using simulation results with the help of a computer code FLUX. The aim is to understand channelling conditions suitable for disorder measurement in crystals. Phase-space distribution of a planar channelled proton beam evolutes in a systematic fashion when it travels into the crystal. Planar channelled beam oscillates between phase-like and space-like conditions in which a part of the beam becomes under phase and space criticalities. These criticality conditions in planar channelling are analysed, explained and discussed with the perspective of defect measurement in crystals.
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61.85.+p
07.78.+s
61.72.-y
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Received: 25 March 2008
Published: 26 September 2008
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