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Microdefects in Te-Rich PbTe Bulk Crystal |
| WANG Geya;SHI Tiansheng;ZHANG Suying* |
| Shanghai Institute of Metallurgy, Academia Sinica, Shanghai 200050
*Shanghai Institute of Technical Physics, Academia Sinica, Shanghai 200083
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| Cite this article: |
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WANG Geya, SHI Tiansheng, ZHANG Suying 1995 Chin. Phys. Lett. 12 469-472 |
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Abstract The microdefects in Te-rich PbTe coating material grown by Bridgman technique have been studied via transmission electron microscopy. The results indicate that the major microdefects in Te-rich PbTe crystal are plate-like defects lying on {100} plane and homogeneously distributed in the matrix with density about 1.7x1016/cm3. They are originated from the precipitation of native point defects in Te-rich PbTe which occured in the cooling and annealing process and presented in the form of plates consisting of Te anti-site atoms or interstitial Te atoms.
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| Keywords:
61.72.-y
61.72.Ff
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Published: 01 August 1995
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| PACS: |
61.72.-y
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(Defects and impurities in crystals; microstructure)
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61.72.Ff
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(Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.))
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