Photoacoustic Spectroscopy Measurement of C<suB>60</suB> Thin Film

Chin. Phys. Lett.

1994, Vol. 11

Issue (2): 102-104 DOI:

Original Articles

Photoacoustic Spectroscopy Measurement of C₆₀ Thin Film

GU Gang;ZANG Wencheng;ZENG Hao;CHEN Geng;DU Youwei;ZHENG Yibin^*;ZHANG Shuyi^*

Laboratory of solid state microstructures, and Department of Physics, Nanjing University, Nanjing 210008 ^*Institute of Acoustics, Nanjing University, Nanjing 210008

Cite this article:

GU Gang, ZANG Wencheng, ZENG Hao et al 1994 Chin. Phys. Lett. 11 102-104

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Abstract Photoacoustic spectroscopy of C₆₀ thin film is presented. The optical band edge of solid C₆₀ and the optical absorption coefficient at absorption edge are determined. A weak absorption shoulder at 1.70eV is observed. While the thickness of C₆₀ thin film is less than 1μm, photoacoustic saturation at band edge is avoided.

Keywords: 71.25.Tn 73.60.Gx 43.35.Ud

Published: 01 February 1994

PACS:	71.25.Tn
	73.60.Gx
	43.35.Ud	(Thermoacoustics, high temperature acoustics, photoacoustic effect)

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y1994/V11/I2/0102

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	GU Gang
	ZANG Wencheng
	ZENG Hao
	CHEN Geng
	DU Youwei
	ZHENG Yibin
	ZHANG Shuyi

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