X-RAY DIFFRACTION OF Cu/Ti FIBONACCI SUPERLATTICES

Chin. Phys. Lett.

1989, Vol. 6

Issue (10): 469-472 DOI:

Original Articles

X-RAY DIFFRACTION OF Cu/Ti FIBONACCI SUPERLATTICES

Zhu Ming;HU An;JIANG Shusheng;QUI Yan;FENG Lhan

Laboratory of Solid State Microstructures, Nanjing University, Nanjing

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Zhu Ming, HU An, JIANG Shusheng et al 1989 Chin. Phys. Lett. 6 469-472

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Abstract 1-D quasiperiodic (Fibonacci) Cu/Ti metallic superlattices have been prepared in a dual magnetron sputter deposition system. X-ray scattering measurements of these samples are presented. The X-ray diffraction peaks at low angles can be indexed by the projection method from the high-dimensional periodic structure. In the high angle region, there is one broad peak, which indicates that the samples are amorphous.

Keywords: 68.65.+g 61.10.-i

Published: 01 October 1989

PACS:	68.65.+g
	61.10.-i

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y1989/V6/I10/0469

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