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Magnetic Force Microscopy Study of Alternate Sputtered (001) Oriented L10 Phase FePt Films |
| XIA Ai-Lin1,2;CAO Jiang-Wei3;TONG Liu-Niu1;WEI Fu-Lin3;YANG Zheng3;HAN Bao-Shan2 |
| 1Anhui Key Laboratory of Metal Materials and Processing, School of Materials Science and Engineering, Anhui University of Technology, Maanshan 243002
2State Key Laboratory of Magnetism, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080
3Research Institute of Magnetic Materials, Lanzhou University, Lanzhou 730000 |
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| Cite this article: |
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XIA Ai-Lin, CAO Jiang-Wei, TONG Liu-Niu et al 2007 Chin. Phys. Lett. 24 222-225 |
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Abstract We present a magnetic force microscopy study of alternate sputtered (001) oriented L10 phase FePt films. It is found that the root-mean-square value of phase shift of magnetic force images, (ΔФ)rms, can be used to characterize the perpendicular anisotropy for a series of specimens. Therefore, the considerable improvement of the perpendicular anisotropy after post-annealing can be characterized. In addition, the magnetic properties, magnetic and crystalline microstructures before and after post-annealing are compared for the typical [Fe5nmPt5nm]10 film with substrate temperature Ts=500°C, single layer thickness d=5nm and total layer thickness D=100nm to confirm the effect of post-annealing on improving the perpendicular anisotropy for Fe--Pt films.
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| Keywords:
75.50.Ss
75.30.Gw
75.60.Ch
68.37.Rt
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Published: 01 January 2007
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| PACS: |
75.50.Ss
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(Magnetic recording materials)
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75.30.Gw
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(Magnetic anisotropy)
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75.60.Ch
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(Domain walls and domain structure)
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68.37.Rt
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(Magnetic force microscopy (MFM))
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