| Original Articles |
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Measurement and Multiple Scattering Correction of K-Shell
Ionization Cross Sections of Silver by Electron Impact |
| ZHOU Chang-Geng;FU Yu-Chuan;AN Zhu;TANG Chang-Huan;LUO Zheng-Ming |
| Key Laboratory for Radiation Physics and Technology of
Education Ministry, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064 |
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| Cite this article: |
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ZHOU Chang-Geng, FU Yu-Chuan, AN Zhu et al 2001 Chin. Phys. Lett. 18 531-532 |
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Abstract The K-Shell ionization cross sections of silver have been measured by electron impact. In order to overcome the difficulties in preparing a self-supporting thin target, a thin target with a thick substrate was used in our experiments. The influence of electrons reflected from the substrate was corrected by means of a detailed calculation of electron transport. The path of the electrons passing through silver target of 31.2μg/cm2 was calculated by the EGS4 Monte Carlo program. This method of correction for the measurement is reported for the first time.
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| Keywords:
34.80.Dp
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Published: 01 April 2001
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| PACS: |
34.80.Dp
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(Atomic excitation and ionization)
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