Chin. Phys. Lett.  1999, Vol. 16 Issue (5): 389-390    DOI:
Original Articles |
Preparation and Microstructure of Nanocrystalline Grain Ag-MgF2 Cermet Film
SUN Zhao-qi;SUN Da-ming;LI Ai-xia;XU Zhi-yuan
Department of Physics, Anhui University, Hefei 230039
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SUN Zhao-qi, SUN Da-ming, LI Ai-xia et al  1999 Chin. Phys. Lett. 16 389-390
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Abstract Nanocrystalline grain Ag-MgF2 cermet films were prepared by using sintered-in-vacuum Ag-MgF2 mixture granules as evaporant. The microstructure and the electronic energy states of the films were examined by x-ray diffraction, transmission electron microscopy, electron diffraction and x-ray photoelectron spectroscopy. The results showed that obtained Ag-MgF2 cermet films consist of mainly amorphous MgF2 matrix with embedded fcc-Ag nanocrystalline grains. The principal x-ray diffraction peaks at d = 3.4245, 2.6102, and 2.0503Ǻ are probably related to Ag-MgF2 cermet composite structure.
Keywords: 81.05.-t      68.55.-a      68.90.+g     
Published: 01 May 1999
PACS:  81.05.-t (Specific materials: fabrication, treatment, testing, and analysis)  
  68.55.-a (Thin film structure and morphology)  
  68.90.+g (Other topics in structure, and nonelectronic properties of surfaces and interfaces; thin films and low-dimensional structures)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1999/V16/I5/0389
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