| Original Articles |
|
|
|
|
Determination of Mean Inner Potential by Electron Holography
Along with Electron Dynamic Simulation |
| WANG Yan-Guo1;LIU Hong-Rong2;YANG Qi-Bin2;ZHANG Ze1 |
| 1Beijing Laboratory of Electron Microscopy, Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
2Institute of Modern Physics, Xiangtan University, Xiangtan 411105
|
|
| Cite this article: |
|
WANG Yan-Guo, LIU Hong-Rong, YANG Qi-Bin et al 2003 Chin. Phys. Lett. 20 2214-2217 |
|
|
|
Abstract Off-axis electron holography in a field-emission-gun transmission electron microscope and electron dynamic simulation is used to determine the mean inner potential of copper. The phase shift of object wave versus specimen thickness is calculated up to 30 nm using electron dynamic formula, and the sample thickness is decided by match of the experimental and calculated phase shift. Based on the measured phase shift, the calculated mean inner potential of Cu is 21.2 V, which agrees with the reported values within the experimental error.
|
| Keywords:
61.14.Nm
61.12.Bt
68.37.Lp
42.30.Rx
|
|
|
Published: 01 December 2003
|
|
|
|
|
|
|
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
