| CROSS-DISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY |
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Near-Field Optical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes |
| Lele Wang1,2, Bosai Lyu1,2, Qiang Gao1,2, Jiajun Chen1,2, Zhe Ying1,2, Aolin Deng1,2, Zhiwen Shi1,2** |
1Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), Shenyang National Laboratory for Materials Science, School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240
2Collaborative Innovation Center of Advanced Microstructures, Nanjing 210093
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| Cite this article: |
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Lele Wang, Bosai Lyu, Qiang Gao et al 2020 Chin. Phys. Lett. 37 028101 |
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Abstract Single-walled carbon nanotubes (SWCNTs), due to their outstanding electrical and optical properties, are expected to have extensive applications, such as in transparent conductive films and ultra-small field-effect transistors (FETs). However, those applications can only be best realized with pure metallic or pure semiconducting SWCNTs. Hence, identifying and separating metallic from semiconducting SWCNTs in as-grown samples are crucial. In addition, knowledge of the type of an SWCNT is also important for further exploring its new properties in fundamental science. Here we report employing scanning near-field optical microscopy (SNOM) as a direct and simple method to identify metallic and semiconducting SWCNTs on SiO$_2$/Si substrates. Metallic and semiconducting SWCNTs show distinct near-field optical responses because the metallic tubes support plasmons whereas the semiconducting tubes do not. The reliability of this method is verified using FET testing and Rayleigh scattering spectroscopy. Our result demonstrates that the SNOM technique provides a reliable, simple, noninvasive and in situ method to distinguish between metallic and semiconducting SWCNTs.
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Received: 24 October 2019
Published: 18 January 2020
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| PACS: |
81.05.U-
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(Carbon/carbon-based materials)
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78.67.-n
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(Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures)
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68.37.Uv
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(Near-field scanning microscopy and spectroscopy)
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| Fund: Supported by the National Natural Science Foundation of China under Grant Nos. 11574204 and 11774224, and the National Key Research and Development Program of China (2016YFA0302001). Z.S. acknowledges the Program for Professor of Special Appointment (Eastern Scholar) at Shanghai Institutions of Higher Learning and additional support from a Shanghai talent program. |
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