Measurement of Refractive Index Ranging from 1.42847 to 2.48272 at 1064 nm Using a Quasi-Common-Path Laser Feedback System
XU Ling, TAN Yi-Dong, ZHANG Shu-Lian** , SUN Li-Qun
The State Key Lab of Precision Measurement Technology and Instrument, Department of Precision Instruments, Tsinghua University, Beijing 100084
Abstract ：Wavelength 1064 nm is one of the most widely used laser wavelengths in industries and science. The high-precision measurement of the refractive index of optical materials at 1064 nm is significant for improving the optical design. We study the direct measurement of refractive index at 1064 nm of lasers, including calcium fluoride (CaF2 ), fused silica and zinc selenide (ZnSe), whose refractive indices cover a large range from 1.42847 to 2.48272. The measurement system is built based on the quasi-common-path Nd:YAG laser feedback interferometry. The thickness can be measured simultaneously with the refractive index. The results demonstrate that the system has absolute uncertainties of ～10?5 and ～10?4 mm in refractive index and thickness measurement, respectively.
收稿日期: 2015-04-28
出版日期: 2015-10-02
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2015, Vol. 32 
