Two Optical Feedback Schemes for Cavity Ring-down Technique for High Reflectivity Measurements
ZHAO Tong-Kai1, QU Zhe-Chao2, HAN Yan-Ling2, LI Bin-Cheng2
1University of Electronic Science and Technology of China, Chengdu 610054 2Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209
Two Optical Feedback Schemes for Cavity Ring-down Technique for High Reflectivity Measurements
ZHAO Tong-Kai1, QU Zhe-Chao2, HAN Yan-Ling2, LI Bin-Cheng2
1University of Electronic Science and Technology of China, Chengdu 610054 2Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209
摘要An optical feedback cavity ring-down (OF-CRD) technique employing a continuous wave Fabry-Perot (F-P) diode laser is investigated for high reflectivity measurement. Two optical feedback (OF) schemes (linear and V-shaped cavity schemes) for the OF-CRD technique are compared in both wavelength and time domains. Due to the OF effect caused by retro-reflection of ring-down cavity back into the laser cavity, large resonance peaks appear in CRD signals in both the schemes. However, due to the differences in the strengths and spectra of the OF, the appearance frequencies and amplitudes of the peaks in the CRD signals in both schemes differ significantly. Simple and low-cost high reflectivity measurement apparatuses are established based on these two OF-CRD schemes and high-accuracy measurements of high reflectivity are experimentally achieved.
Abstract：An optical feedback cavity ring-down (OF-CRD) technique employing a continuous wave Fabry-Perot (F-P) diode laser is investigated for high reflectivity measurement. Two optical feedback (OF) schemes (linear and V-shaped cavity schemes) for the OF-CRD technique are compared in both wavelength and time domains. Due to the OF effect caused by retro-reflection of ring-down cavity back into the laser cavity, large resonance peaks appear in CRD signals in both the schemes. However, due to the differences in the strengths and spectra of the OF, the appearance frequencies and amplitudes of the peaks in the CRD signals in both schemes differ significantly. Simple and low-cost high reflectivity measurement apparatuses are established based on these two OF-CRD schemes and high-accuracy measurements of high reflectivity are experimentally achieved.
(Resonators, cavities, amplifiers, arrays, and rings)
引用本文:
ZHAO Tong-Kai;QU Zhe-Chao;HAN Yan-Ling;LI Bin-Cheng
. Two Optical Feedback Schemes for Cavity Ring-down Technique for High Reflectivity Measurements[J]. 中国物理快报, 2010, 27(10): 100701-100701.
ZHAO Tong-Kai, QU Zhe-Chao, HAN Yan-Ling, LI Bin-Cheng
. Two Optical Feedback Schemes for Cavity Ring-down Technique for High Reflectivity Measurements. Chin. Phys. Lett., 2010, 27(10): 100701-100701.
[1] Herbelin J M and McKay J A 1981 Appl. Opt. 24 3341
[2] Abramovici A et al 1992 Science 256 325
[3] Cole S T et al 2000 Opt. Express 7 285
[4] ISO 15368: 2001(E) Measurement of Reflectance of Plane Surfaces and Transmittance of Plane Parallel Elements (Bern: International Organization for Standardization)
[5] ISO 13697: 2006(E) Test Methods for Specular Reflectance and Regular Transmittance of Optical Laser Components (Bern: International Organization for Standardization)
[6] Gao L F et al 2005 Proc. SPIE 5963 59632F
[7] O'Keefe A et al 1988 Rev. Sci. Instrum. 59 2544
[8] Romanini D et al 1997 Chem. Phys. Lett. 264 316
[9] Kasyutich V L et al 2002 Appl. Phys. B 75 755
[10] Berden G et al 2000 Int. Rev. in Phys. Chem. 19 565
[11] Debecker I et al 2005 Opt. Express 13 2906
[12] Morville J et al 2002 Proc. SPIE 4485 236
[13] Morville J et al 2004 Appl. Phys. B 78 465
[14] Motto-Ros V et al 2008 Appl. Phys. B 91 203
[15] Morville J et al 2005 Appl. Phys. B 80 1027
[16] Gong Y, Li B C and Han Y L 2008 Appl. Phys. B 93 355
[17] Lang R et al 1980 J. Quantum. Electron. 16 347
[18] Tronciu V Z et al 2006 Phys. Rev. E 73 046205
[19] Ruiz-Oliveras F R et al 2006 Opt. Express 14 12859
[20] Tkach R W et al 1986 J. Lightwave Technol. 4 1655
[21] Ermakov I V et al 2009 Opt. Express 17 8749
[22] Duparre A and Ristau D 2010 Optical Interference Coatings (Tucson, Arizona, USA 6-11 June 2010)
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