Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method
CHENG Chuan-Fu1,2, LIU Chun-Xiang2, TENG Shu-yun1, ZHANG Ning-Yu3, LI Ru-Xin1, XU Zhi-Zhan1
1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 201800
2Department of Physics, Shandong Normal University, Ji’nan 250014
3Shandong Institute of Architecture, Ji’nan 250014
Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method
1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 201800
2Department of Physics, Shandong Normal University, Ji’nan 250014
3Shandong Institute of Architecture, Ji’nan 250014
Abstract： Theoretical analysis shows that the deviation roughness w and lateral correlation length ξ of a weak scattering object determine the different properties of the contrast of the speckles in the image plane of a 4f system. Experimentally, we have measured the data of the speckle contrast versus the radius R of the variable filtering aperture. By fitting the theoretical results to these data, the parameters w and ξ of the random surfaces with Gaussian correlation are extracted. This method can determine the two parameters simultaneously and independently, and pre-calibrations are not needed.
CHENG Chuan-Fu;LIU Chun-Xiang;TENG Shu-yun;ZHANG Ning-Yu;LI Ru-Xin;XU Zhi-Zhan. Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method[J]. 中国物理快报, 2002, 19(9): 1283-1286.
CHENG Chuan-Fu, LIU Chun-Xiang, TENG Shu-yun, ZHANG Ning-Yu, LI Ru-Xin, XU Zhi-Zhan. Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method. Chin. Phys. Lett., 2002, 19(9): 1283-1286.
2002, Vol. 19 
