Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon
DAI Hai-Tao, WANG Xin, XU Ke-Shu
State Key Laboratory for Advanced Photonic Materials and Devices, Department of Optical Science and Engineering, Fudan University, Shanghai 200433
Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon
DAI Hai-Tao;WANG Xin;XU Ke-Shu
State Key Laboratory for Advanced Photonic Materials and Devices, Department of Optical Science and Engineering, Fudan University, Shanghai 200433
关键词 :
42.79.Hp ,
42.79.Ls ,
42.30.Kq ,
42.25.Fx
Abstract : The focusing properties of fractal zone plates (FZPs) with different structure parameters are studied experimentally. The axial irradiance of FZPs is deduced at n=4. The experimental results are in good agreement with the theoretical prediction. A method to fabricate FZPs with variable structure parameters is mentioned, and the liquid-crystal-on-silicon device is used to implement this experiment. The experimental results indicate that the focal depth of lower order FZPs is larger than that of higher order FZPs.
Key words :
42.79.Hp
42.79.Ls
42.30.Kq
42.25.Fx
出版日期: 2005-11-01
:
42.79.Hp
(Optical processors, correlators, and modulators)
42.79.Ls
(Scanners, image intensifiers, and image converters)
42.30.Kq
(Fourier optics)
42.25.Fx
(Diffraction and scattering)
引用本文:
DAI Hai-Tao;WANG Xin;XU Ke-Shu. Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon[J]. 中国物理快报, 2005, 22(11): 2851-2854.
DAI Hai-Tao, WANG Xin, XU Ke-Shu. Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon. Chin. Phys. Lett., 2005, 22(11): 2851-2854.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2005/V22/I11/2851
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