中国物理快报  2021, Vol. 38 Issue (11): 110302-    DOI: 10.1088/0256-307X/38/11/110302
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Random-Gate-Voltage Induced Al'tshuler–Aronov–Spivak Effect in Topological Edge States
Kun Luo1, Wei Chen1,2*, Li Sheng1,2, and D. Y. Xing1,2
1National Laboratory of Solid State Microstructures and School of Physics, Nanjing University, Nanjing 210093, China
2Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China