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Near-Field Characterization of Optical Micro/Nanofibres |
| MA Zhe;WANG Shan-Shan;YANG Qing;TONG Li-Min |
| State Key Laboratory of Modern Optical Instrumentation, Department of Optical Engineering, Zhejiang University, Hangzhou 310027 |
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| Cite this article: |
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MA Zhe, WANG Shan-Shan, YANG Qing et al 2007 Chin. Phys. Lett. 24 3006-3008 |
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Abstract Near-field scanning optical microscopy is used to investigate the waveguiding properties of optical micro/nanofibres (MNFs) by means of detecting optical power carried by evanescent waves. Taper drawn silica and tellurite MNFs, supported on low-index substrates, are used to guide a 532-nm-wavelength light beam for the test. Modification of the single-mode condition of the MNF in the presence of a substrate is observed. Spatial modulation of the longitudinal field intensity (with a 195-nm period) near the output end of a 760-nm-diameter silica MNF is well resolved. Energy exchange through evanescent coupling between two parallel MNFs is also investigated.
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| Keywords:
87.64.Xx
42.79.Gn
78.67.-n
81.07.-b
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Received: 15 June 2007
Published: 20 September 2007
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| PACS: |
87.64.Xx
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42.79.Gn
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(Optical waveguides and couplers)
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78.67.-n
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(Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures)
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81.07.-b
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(Nanoscale materials and structures: fabrication and characterization)
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