Chin. Phys. Lett.  2001, Vol. 18 Issue (6): 759-760    DOI:
Original Articles |
Measurement and Correction of K-Shell Ionization Cross Sections for Copper and Gallium by Electron Impact
ZHOU Chang-Geng;AN Zhu;LUO Zheng-Ming
Key Laboratory for Radiation Physics and Technology of Education Ministry, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064
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ZHOU Chang-Geng, AN Zhu, LUO Zheng-Ming 2001 Chin. Phys. Lett. 18 759-760
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Abstract The K-Shell ionization cross sections of Cu and Ga are measured by electron impact and the data of Ga are reported for the first time. The method of a thin chemical compound target with a thick substrate is formally used in the experiment. The influence of electrons reflected from the substrate is corrected by means of a calculation of electron transport.
Keywords: 34.80.Dp     
Published: 01 June 2001
PACS:  34.80.Dp (Atomic excitation and ionization)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2001/V18/I6/0759
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ZHOU Chang-Geng
AN Zhu
LUO Zheng-Ming
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