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A SIMPLE APPROACH OF MEASURING INVERSE PHOTOEMISSION SPECTRA WITH HIGH RESOLUTION AND HIGH EFFICIENCY |
| HU Jihuang;YANG Zhijian;DAI Daoxuan |
| Surface Physics Laboratory, Fudan University, Shanghai |
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| Cite this article: |
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HU Jihuang, YANG Zhijian, DAI Daoxuan 1989 Chin. Phys. Lett. 6 101-103 |
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Abstract A relatively simple and inexpensive inverse photoemission spectrometer (IPS) with high resolution and high efficiency has been set up. Using this IPS, the inverse photoemission spectrum of Si(100)2x1 surface has been obtained. The resolution of the spectrum is better than 0.5eV at 9.8eV photon energy with a counting rate about 103/.μA-S .sr.
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07.65.E
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Published: 01 March 1989
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