Chin. Phys. Lett.  2020, Vol. 37 Issue (7): 070701    DOI: 10.1088/0256-307X/37/7/070701
GENERAL |
A New Approach for Residual Stress Analysis of GH3535 Alloy by Using Two-Dimensional Synchrotron X-Ray Diffraction
Sheng Jiang1,2*, Ji-Chao Zhang1, Shuai Yan1, and Xiao-Li Li2
1Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China
2Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201203, China
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Sheng Jiang, Ji-Chao Zhang, Shuai Yan et al  2020 Chin. Phys. Lett. 37 070701
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Abstract We propose a new method to evaluate residual stress based on the analysis of a portion of a Debye ring with two-dimensional synchrotron x-ray diffraction. The residual stress of a nickel-based alloy GH3535 evaluated by the proposed method is determined to be $-1149\pm34$ MPa based on the quantitative analysis of the deformation of the (200) reflection, and the residual stress obtained by analyzing THE (111) plane is $-933\pm 68$ MPa. The results demonstrate that the GH3535 alloy surface is highly compressive, as expected for a polishing surface treatment. The proposed method provides insight into the field of residual stress measurement and quantitative understanding of the residual stress states in GH3535.
Received: 31 December 2019      Published: 21 June 2020
PACS:  07.85.Qe (Synchrotron radiation instrumentation)  
  68.35.Gy (Mechanical properties; surface strains)  
  61.66.Dk (Alloys )  
  61.72.Dd (Experimental determination of defects by diffraction and scattering)  
Fund: Supported by the National Key Scientific Instrument and Equipment Development Projects of China under Grant No. 2017YFA0403401, the Natural Science Foundation of Shanghai under Grant No. 18ZR1448100, and the National Natural Science Foundation of China under Grant Nos. 11705270 and 11104307.
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http://cpl.iphy.ac.cn/10.1088/0256-307X/37/7/070701       OR      http://cpl.iphy.ac.cn/Y2020/V37/I7/070701
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Sheng Jiang
Ji-Chao Zhang
Shuai Yan
and Xiao-Li Li
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