Chin. Phys. Lett.  2014, Vol. 31 Issue (03): 030701    DOI: 10.1088/0256-307X/31/3/030701
GENERAL |
Coating Qualities Evaluation for Alkali-Metal Atomic Vapor Cells Based on Frustrated Total Internal Reflection
QUAN Wei1,2, LIU Yang1,2**, CHEN Yao1,2
1Science and Technology on Inertial Laboratory, Beihang University, Beijing 100191
2Fundamental Science on Novel Instrument and Navigation System Technology Laboratory, Beihang University, Beijing 100191
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QUAN Wei, LIU Yang, CHEN Yao 2014 Chin. Phys. Lett. 31 030701
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Abstract To realize accurate measurement of coating thickness and surface reliefs for alkali-metal vapor cells, a measurement method based on frustrated total internal reflection (FTIR) is proposed. Firstly, the phenomenon of frustrated total internal reflection and the theory of coating thickness measurement based on FTIR are introduced. Then a coating thickness measuring system based on FTIR is established and the coating thickness measuring experiment is carried out. Next, surface reliefs are obtained by analyzing distributions of the data of coating thickness. The experimental results indicate that the FTIR method can measure coating thickness exactly with an accuracy better than 2 nm, which can satisfy the evaluation of coating qualities for alkali-metal vapor cells.
Received: 01 November 2013      Published: 28 February 2014
PACS:  07.77.-n (Atomic, molecular, and charged-particle sources and detectors)  
  87.16.Gj (Cell walls)  
  42.79.Wc (Optical coatings)  
  78.66.Sq (Composite materials)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/31/3/030701       OR      https://cpl.iphy.ac.cn/Y2014/V31/I03/030701
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QUAN Wei
LIU Yang
CHEN Yao
[1] Dong H F, Fang J C, Qin J and Chen Y 2011 Opt. Commun. 284 2886
[2] Fang J C and Qin J 2012 Rev. Sci. Instrum. 83 103104
[3] Dmitry B and Michael R 2007 Nat. Phys. 3 227
[4] Seltzer S J, Rampulla D, Chabal Y J et al 2008 J. Appl. Phys. 104 103116
[5] Balabas M V, Jensen K and Wasilewski W et al 2010 Opt. Express 18 5825
[6] Guo C and Li B C 2013 Opt. Precis. Eng. 21 858 (in Chinese)
[7] Guo C, Lin D W, Zhang Y D et al 2008 Acta Opt. Sin. 31 0731001 (in Chinese)
[8] Xue H, Shen W D, Gu P F et al 2009 Acta Opt. Sin. 29 1877 (in Chinese)
[9] Chen K, Cui M Q, Zheng L et al 2008 High Power Laser Part. Beams 26 234 (in Chinese)
[10] Seltzer S J 2008 PhD Dissertation (USA: Princeton University)
[11] Florian M and Berngard G Z 2009 IEEE Trans. Instrum. Meas. 58 1958
[12] Wilfeied S 2012 Eur. J. Phys. 33 443
[13] Chen Y Y, Liao H Y, Shi J L et al 2010 J. Opt. 12 045105
[14] Jia X T 2011 PhD Dissertation (Wuhan: Huazhong University of Science and Technology) (in Chinese)
[15] Shi J H 2007 PhD Dissertation (Harbin: Harbin Engineering University) (in Chinese)
[16] Yang Z Y, Zhou Z F and Zhang Z L 2012 Opt. Precis. Eng. 20 692 (in Chinese)
[17] Yu S S 2012 PhD Dissertation (Harbin: Harbin Engineering University) (in Chinese)
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