| FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
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Optical Bistability in Ag/Dielectric Multilayers |
| LI Heng,SHENG Chuan-Xiang**,CHEN Qian |
| School of Electronic Engineering and Optoelectronics Technology, Nanjing University of Science and Technology, Nanjing 210094 |
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| Cite this article: |
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LI Heng, SHENG Chuan-Xiang, CHEN Qian 2012 Chin. Phys. Lett. 29 054201 |
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Abstract We numerically study the optical bistability (OBIS) in periodic multilayers of Ag/SiO2. The calculated dependence of the output on the input intensity shows two possible OBIS states at the test wavelength. One is due to the field localization effects in silver layers with nonlinear refractive index modifying resonant tunneling of electromagnetic waves; the other, with about a three times lower threshold input intensity, is attributed to the intensity dependence change of the Ag/SiO2 composite's effective dielectric constant from metallic−like (negative) to dielectric-like (positive). With appropriate design engineering the Ag/SiO2 multilayers could find broad applications in all-optical information processes.
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Received: 19 August 2011
Published: 30 April 2012
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| PACS: |
42.65.Pc
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(Optical bistability, multistability, and switching, including local field effects)
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42.70.Qs
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(Photonic bandgap materials)
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78.66.Bz
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(Metals and metallic alloys)
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