| CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES |
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Thermal Stability and Growth Behavior of Erbium Silicide Nanowires Self-Assembled on a Vicinal Si(001) Surface |
| DING Tao1,2, SONG Jun-Qiang1, LI Juan1, CAI Qun1**
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1State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433
2Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092
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| Cite this article: |
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DING Tao, SONG Jun-Qiang, LI Juan et al 2011 Chin. Phys. Lett. 28 066801 |
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Abstract Erbium silicide nanowires are self-assembled on vicinal Si(001) substrates after electron beam evaporation and post annealing at 630°C In−situ scanning tunneling microscopy investigations manifest that the nanowires will successively shrink and transform into a nanoisland with annealing prolonged. Meanwhile, a structural transition from hexagonal AlB2 phase to tetragonal ThSi2 phase is revealed with high-resolution transmission electron microscopy. It is also found that the nanowires gradually expand to embed into the substrates during the growth process, which has much influence on the shape instability of nanowires. Additionally, a multiple deposition-annealing treatment is given as a novel growth method to strengthen the controlled fabrication of nanowires.
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| Keywords:
68.37.Ef
68.37.Lp
68.60.Dv
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Received: 18 January 2011
Published: 29 May 2011
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| PACS: |
68.37.Ef
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(Scanning tunneling microscopy (including chemistry induced with STM))
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68.37.Lp
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(Transmission electron microscopy (TEM))
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68.60.Dv
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(Thermal stability; thermal effects)
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