Chin. Phys. Lett.  2011, Vol. 28 Issue (6): 064301    DOI: 10.1088/0256-307X/28/6/064301
FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
A Baseline-Free Defect Imaging Technique in Plates Using Time Reversal of Lamb Waves
Hyunjo Jeong**, Sungjong Cho, Wei Wei
Division of Mechanical and Automotive Engineering, Wonkwang University, Iksan, Jeonbuk 570-749, Korea
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Hyunjo Jeong, Sungjong Cho, Wei Wei 2011 Chin. Phys. Lett. 28 064301
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Abstract We present an analytical investigation for a baseline-free imaging of a defect in plate-like structures using the time-reversal of Lamb waves. We first consider the flexural wave (A0 mode) propagation in a plate containing a defect, and reception and time reversal process of the output signal at the receiver. The received output signal is then composed of two parts: a directly propagated wave and a scattered wave from the defect. The time reversal of these waves recovers the original input signal, and produces two additional sidebands that contain the time-of-flight information on the defect location. One of the side-band signals is then extracted as a pure defect signal. A defect localization image is then constructed from a beamforming technique based on the time-frequency analysis of the side band signal for each transducer pair in a network of sensors. The simulation results show that the proposed scheme enables the accurate, baseline-free imaging of a defect.
Keywords: 43.35.Cg      43.60.Tj      43.60.Lq     
Received: 06 January 2011      Published: 29 May 2011
PACS:  43.35.Cg (Ultrasonic velocity, dispersion, scattering, diffraction, and Attenuation in solids; elastic constants)  
  43.60.Tj (Wave front reconstruction, acoustic time-reversal, and phase conjugation)  
  43.60.Lq (Acoustic imaging, displays, pattern recognition, feature extraction)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/28/6/064301       OR      https://cpl.iphy.ac.cn/Y2011/V28/I6/064301
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Hyunjo Jeong
Sungjong Cho
Wei Wei
[1] Ng C T and Veidt M 2009 Smart Mater. Struct. 18 074006
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[10] Jeong H and Jang Y-S 2000 IEEE Trans. UFFC 47 612
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