Chin. Phys. Lett.  2009, Vol. 26 Issue (9): 097901    DOI: 10.1088/0256-307X/26/9/097901
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Explanation of Laser-Induced Damage Behavior of Fused Silica in a Large-Aperture Laser using a Small-Aperture Damage Test
HUANG Wan-Qing, HAN Wei, WANG Hai-Jun, MIAO Xin-Xiang, YE Ya-Yun, LI
Fu-Quan, FENG Bin, JING Feng, ZHENG Wan-Guo
Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900
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HUANG Wan-Qing, HAN Wei, WANG Hai-Jun et al  2009 Chin. Phys. Lett. 26 097901
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Abstract Laser-induced damage is a key lifetime limiter for optics in large laser facilities. Fused silica is tested to find the damage threshold on two different laser facilities of different apertures. The damage threshold shows that the corners of the component are less damage resistant. The acid etch on a corner does not effectively increase the damage threshold. A statistics-based model is presented to extrapolate the threshold data in a small-aperture test to predict the damage threshold under functional conditions.
Keywords: 79.20.Ds      42.70.Ce     
Received: 25 February 2009      Published: 28 August 2009
PACS:  79.20.Ds (Laser-beam impact phenomena)  
  42.70.Ce (Glasses, quartz)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/26/9/097901       OR      https://cpl.iphy.ac.cn/Y2009/V26/I9/097901
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HUANG Wan-Qing
HAN Wei
WANG Hai-Jun
MIAO Xin-Xiang
YE Ya-Yun
LIFu-Quan
FENG Bin
JING Feng
ZHENG Wan-Guo
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[8] Feit M D et al 1999 Proc. SPIE 3578 226
[9] Weibull W 1951 Appl. Mech. Trans. ASME 18 293
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