Phase Transformation and Enhancing Electron Field Emission Properties in Microcrystalline Diamond Films Induced by Cu Ion Implantation and Rapid Annealing
Yan-Yan Shen** , Yi-Xin Zhang, Ting Qi, Yu Qiao, Yu-Xin Jia, Hong-Jun Hei, Zhi-Yong He, Sheng-Wang Yu**
Research Institute of Surface Engineering, Taiyuan University of Technology, Taiyuan 030024
Abstract :Cu ion implantation and subsequent rapid annealing at 500$^{\circ}\!$C in N$_{2}$ result in low surface resistivity of 1.611 ohm/sq with high mobility of 290 cm$^{2}$V$^{-1}$S$^{-1}$ for microcrystalline diamond (MCD) films. Its electrical field emission behavior can be turned on at $E_{0}=2.6$ V/μm, attaining a current density of 19.5 $\mu$A/cm$^{2}$ at an applied field of 3.5 V/μm. Field emission scanning electron microscopy combined with Raman and x-ray photoelectron microscopy reveal that the formation of Cu nanoparticles in MCD films can catalytically convert the less conducting disorder/a-C phases into graphitic phases and can provoke the formation of nanographite in the films, forming conduction channels for electron transportation.
收稿日期: 2016-05-02
出版日期: 2016-08-31
:
81.05.ug
(Diamond)
68.55.Ln
(Defects and impurities: doping, implantation, distribution, concentration, etc.)
73.25.+i
(Surface conductivity and carrier phenomena)
引用本文:
. [J]. 中国物理快报, 2016, 33(08): 88101-088101.
Yan-Yan Shen, Yi-Xin Zhang, Ting Qi, Yu Qiao, Yu-Xin Jia, Hong-Jun Hei, Zhi-Yong He, Sheng-Wang Yu. Phase Transformation and Enhancing Electron Field Emission Properties in Microcrystalline Diamond Films Induced by Cu Ion Implantation and Rapid Annealing. Chin. Phys. Lett., 2016, 33(08): 88101-088101.
链接本文:
https://cpl.iphy.ac.cn/CN/10.1088/0256-307X/33/8/088101
或
https://cpl.iphy.ac.cn/CN/Y2016/V33/I08/88101
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