Multiple Ionization of Argon Induced by Carbon Ions at 20–500 keV/u Energies
NIU Shu-Tong1 , LIU Wen-Biao1 , YANG Ai-Xiang1 , HAN Cheng-Zhi1 , HU Wei1,2 , WEN Zhi-Wen1 , GAO Zhi-Min3 , SHAO Jian-Xiong1 , CHEN Xi-Meng1**
1 School of Nuclear Science and Technology, Lanzhou University, Lanzhou 7300002 No.504 Plant, China National Nuclear Corporation, Lanzhou 7300653 Gansu Nuclear and Radiation Safety Center, Lanzhou 730000
Abstract ：We measure the multiple ionization cross-section ratios Rk 1 of Ar impacted by Cq+ q =1–3) ions in the energy range of 20–500 keV/u. The measured ratios Rk 1 increase with the projectile energy at lower energies, and reach the maximum at energies of 50–150 keV/u, then decrease for higher energies. We also use the classical over barrier ionization model to calculate the ratios Rk 1, and the calculation results are in good agreement with the data, which suggest that the multiple ionization process is described by the sequential over-barrier ionization process.
收稿日期: 2015-03-08
出版日期: 2015-07-30
:
34.50.Fa
(Electronic excitation and ionization of atoms (including beam-foil excitation and ionization))
34.80.Dp
(Atomic excitation and ionization)
引用本文:
. [J]. 中国物理快报, 2015, 32(07): 73401-073401.
链接本文:
https://cpl.iphy.ac.cn/CN/10.1088/0256-307X/32/7/073401
或
https://cpl.iphy.ac.cn/CN/Y2015/V32/I07/73401
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2015, Vol. 32 
