Optically Forbidden Excitations of 2s Electron of Neon Studied by Fast Electron Impact
GE Min, ZHU Lin-Fan, LIU Cun-Ding, XU Ke-Zun
Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei 230026
Optically Forbidden Excitations of 2s Electron of Neon Studied by Fast Electron Impact
GE Min, ZHU Lin-Fan, LIU Cun-Ding, XU Ke-Zun
Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei 230026
摘要The electron energy loss spectrum in the energy region of 42--48.5eV of neon is measured with an angle-resolved fast-electron energy-loss spectrometer at an incident electron energy of 2500eV. Besides the dipole-allowed autoionization transitions of 2s-1np(n=3,4) and 2p-23s3p, the dipole-forbidden ones of 2s-1ns(n=3-6) and 2-13d are observed. The line profile parameters, i.e. Er, Γ and q for these transitions, are determined, and the momentum transfer dependence behaviour is discussed.
Abstract：The electron energy loss spectrum in the energy region of 42--48.5eV of neon is measured with an angle-resolved fast-electron energy-loss spectrometer at an incident electron energy of 2500eV. Besides the dipole-allowed autoionization transitions of 2s-1np(n=3,4) and 2p-23s3p, the dipole-forbidden ones of 2s-1ns(n=3-6) and 2-13d are observed. The line profile parameters, i.e. Er, Γ and q for these transitions, are determined, and the momentum transfer dependence behaviour is discussed.
(Electronic excitation and ionization of atoms (including beam-foil excitation and ionization))
引用本文:
GE Min;ZHU Lin-Fan;LIU Cun-Ding;XU Ke-Zun. Optically Forbidden Excitations of 2s Electron of Neon Studied by Fast Electron Impact[J]. 中国物理快报, 2008, 25(10): 3646-3648.
GE Min, ZHU Lin-Fan, LIU Cun-Ding, XU Ke-Zun. Optically Forbidden Excitations of 2s Electron of Neon Studied by Fast Electron Impact. Chin. Phys. Lett., 2008, 25(10): 3646-3648.
[1] Fano U 1961 Phys. Rev. 124 1866 [2] Fano U and Cooper J W 1965 Phys. Rev. 138 A400 [3] Tanner G, Richter K and Rost J M 2000 Rev. Mod. Phys. 72497 [4] Madden R P and Codling K 1963 Phys. Rev. Lett. 10 516 [5] Cooper J W, Fano U and Prats F 1963 Phys. Rev. Lett. 10518 [6] Schulz K, Kaindl G, Domke M et al 1996 Phys. Rev.Lett. 77 3086 [7] Liu X J, Zhu L F, Yuan Z S et al 2003 Phys. Rev.Lett. 91 193203 [8] Zhong Z P, Wu S L, Feng R F et al 1997 Phys. Rev. A55 3388 [9] Zhu L F, Cheng H D, Liu X J et al 2003 Chin. Phys.Lett. 20 1718 [10] Wu S L, Zhong Z P, Feng R F et al 1995 Phys. Rev. A51 4494 [11] Yuan Z S, Zhu L F, Liu X J et al 2002 Phys. Rev. A66 062701 [12] Yuan Z S, Zhu L F, Liu X J et al 2002 Chin. Phys.Lett. 19 495 [13] Yuan Z S, Sakai Y, Umeda N et al 2006 J. Phys. B 395097 [14] Codling K, Madden R P and Ederer D L 1967 Phys. Rev. 15526 [15] Aleksandrov Y M, Gruzdev P F, Kozlov M G et al 1983Opt. Spektrosk. 54 7 [Opt. Spectrosc. (USSR) 54 4 1983] [16] Simpson J A, Mielczarek S R and Cooper J 1964 J. Opt.Soc. Am. 54 269 [17] Simpson J A, Chamberlain G E and Mielczarek S R 1965Phys. Rev. 139 A1039 [18] Brion C E and Olsen A R 1970 J. Phys. B 3 1020 [19] Chan W F, Cooper G, Guo X and Brion C E 1992 Phys. Rev. A45 1420 [20] Fano U and Cooper J W 1965 Phys. Rev. 137 A1364 [21] Burke P G and Taylor K T 1975 J. Phys. B 8 2620 [22] Luke T M 1973 J. Phys. B 6 30 [23] Sewell K 1965 J. Opt. Soc. Am. 55 739 [24] Liu X J, Zhu L F, Jiang X M et al 2001 Rev. Sci.Instrum. 72 3357 [25] Liu X J, Huang Y P, Zhu L F et al 2003 Nucl.Instrum. Methods 508 448 [26] Cooper J W 1962 Phys. Rev. 128 681
2008, Vol. 25 
