Photodarkening in Amorphous As2 S3 Thin Films
LIU Qi-Ming, GAN Fu-Xi
Shanghai Institute of Optics and Fine Mechanics, Chinese
Academy of Sciences, P.O. Box 800-216, Shanghai 201800
Photodarkening in Amorphous As2 S3 Thin Films
LIU Qi-Ming;GAN Fu-Xi
Shanghai Institute of Optics and Fine Mechanics, Chinese
Academy of Sciences, P.O. Box 800-216, Shanghai 201800
关键词 ：
78.20.Ci ,
78.66.Jg
Abstract ： The photodarkening effect in amorphous As2 S3 films is studied. The optical absorption edge shifts to lower energy after illumination at the bandgap light of 514.5 nm wavelength by an argon laser. The shift in well-annealed films can be recovered by annealing at 180°C for 1 h but in un-annealed films it is irreversible. In addition, it was found that the magnitude of photodarkening ΔE increased with the increase of illumination light intensity and illumination time. The reversibility of photodarkening in amorphous As2 S3 films can be applied in optical memories.
Key words ：
78.20.Ci
78.66.Jg
出版日期: 2002-01-01
:
78.20.Ci
(Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))
78.66.Jg
(Amorphous semiconductors; glasses)
[1]
FENG Shuai;WANG Yi-Quan;LI Zhi-Yuan;CHENG Bing-Ying; ZHANG Dao-Zhong. Imaging Properties of a Rectangular-Lattice Metallic Photonic-Crystal Slab
[2]
ZHANG Zeng-Yan;JI Te;YU Xiao-Han;XIAO Ti-Qiao;XU Hong-Jie. A Method for Quantitative Analysis of Chemical Mixtures with THz Time Domain Spectroscopy
[3]
ZHANG Hong-Jun;;GONG Shang-Qing;NIU Yue-Ping;LI Ru Xin;XU Zhi-Zhan. Negative Refractive Index in a Four-Level Atomic System
[4]
SHEN Yi-Feng;XU Chun;TANG Yun-Fei;LIU Xiao-Han;ZI Jian;CHEN Hong. Ultra-Compact, Subwavelength and Single-Mode Cavity Resonator
[5]
ZHONG Yu;SHEN Lin-Fang;RAN Li-Xin;CHEN Xu-Dong;Liisi JylhäTomasz M. Grzegorczyk;Jin Au Kong;. Reflection and Refraction on the Boundary of a Left-Handed Material with a Hyperbolic Dispersion Relation
[6]
LIANG Xin-Gang;HAN Mao-Hua. Experimental Study on Coherence of Thermal Radiation of Thin Film Structures
[7]
FENG Shuai; SUN Mei;REN Cheng;REN Kun;FENG Zhi-Fang;LI Zhi-Yuan; CHENG Bing-Ying;ZHANG Dao-Zhong. Negative Refraction and Imaging in a Triangular-Lattice Metallic Photonic-Crystal Slab
[8]
CAI Xiao-Bing;ZHOU Xiao-Ming;HU Geng-Kai;. Numerical Study on Left-Handed Materials Made of Ferrite and Metallic Wires
[9]
LI Chao;LI Fang. Resolution Ability and Surface Bright Spots of a Lossy Left-handed Material Slab
[10]
YAN Feng-Ping;JIAN Shui-Sheng;WANG Lin;Kenichi OGATA;Kazuto KOIKE;Shigehiko SASA;Masatake INOUE;Mitsuaki YANO;. Measurement of Mg Content in Zn1-x Mgx O Films by Electron Probe Microanalysis
[11]
JIAN Zhi-Jian;PENG Jing-Cui;ZHOU Ren-Long. Focusing Properties in Photonic Crystal Structure Formed by Air Holes in Dielectric Background with Concave Interface
[12]
SHU Wei-Xing;LUO Hai-Lu;LI Fei;REN Zhong-Zhou. Anomalous Propagation of Electromagnetic Waves in Anisotropic Media with a Unique Dispersion Relation
[13]
WANG Bao-Ling;HU Li-Li;ZHANG Li-Yan;ZHAO Shi-Long. Preparation and Characterization of Hybrid ZnO/Ormosils Films
[14]
CHEN Chen-Jia;WANG Xue-Zhong;Vittorio BELLANI;Angiolino STELLA. Studies of Spectroscopic Ellipsometry in Cd1-x Mnx Te/CdTe Superlattices
[15]
WANG Li-Gang. Beam Displacement in a Layered Configuration due to Formation of Standing Waves
2002, Vol. 19 
