中国物理快报  2006, Vol. 23 Issue (2): 313-315    
  Original Articles 本期目录 | 过刊浏览 | 高级检索 |
Measurement of Mg Content in Zn1-xMgxO Films by Electron Probe Microanalysis
YAN Feng-Ping1,2, JIAN Shui-Sheng1, WANG Lin1, Kenichi OGATA3, Kazuto KOIKE2, Shigehiko SASA2,3, Masatake INOUE2,3, Mitsuaki YANO2,3
1Institute of Lightwave Technology, Beijing Jiaotong University, Beijing 100044 2New Material Research Center, Osaka Institute of Technology, Asahi-ku, Ohmiya, 535-8585, Osaka, Japan 3Bio Venture Center, Osaka Institute of Technology, Asahi-ku, Ohmiya, 535-8585, Osaka, Japan
Measurement of Mg Content in Zn1-xMgxO Films by Electron Probe Microanalysis
YAN Feng-Ping1,2;JIAN Shui-Sheng1;WANG Lin1;Kenichi OGATA3;Kazuto KOIKE2;Shigehiko SASA2,3;Masatake INOUE2,3;Mitsuaki YANO2,3
1Institute of Lightwave Technology, Beijing Jiaotong University, Beijing 100044 2New Material Research Center, Osaka Institute of Technology, Asahi-ku, Ohmiya, 535-8585, Osaka, Japan 3Bio Venture Center, Osaka Institute of Technology, Asahi-ku, Ohmiya, 535-8585, Osaka, Japan