中国物理快报  2010, Vol. 27 Issue (7): 74206-074206    DOI: 10.1088/0256-307X/27/7/074206
  FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) 本期目录 | 过刊浏览 | 高级检索 |
A Novel Micro-Displacement Measuring Method Based on Optical Path Modulation

QU Wei1,2, YE Hong-An1,2

1The Key Lab of Electronics Engineering, College of Heilongjiang Province, Heilongjiang University, Harbin 150080 2College of Electronic Engineering, Heilongjiang University, Harbin 150080
A Novel Micro-Displacement Measuring Method Based on Optical Path Modulation

QU Wei1,2, YE Hong-An1,2

1The Key Lab of Electronics Engineering, College of Heilongjiang Province, Heilongjiang University, Harbin 150080 2College of Electronic Engineering, Heilongjiang University, Harbin 150080